Diffraction phase microscopy with white light

Renjie Zhou (Inventor), Mustafa A H Mir (Inventor), Basanta Bhaduri (Inventor), Paul Scott Carney (Inventor), Tae Woo Kim (Inventor), Gabriel Popescu (Inventor), S Darin Babacan (Inventor), Hoa V Pham (Inventor), Lynford L Goddard (Inventor)

Research output: Patent


A microscope and methods for obtaining a phase image of a substantially transparent specimen. Light collected from a specimen illuminated by a temporally incoherent source is diffracted into a first order and either the zeroth or first order is low-pass filtered in a Fourier transform plane before the orders are recombined at a focal plane detector. By low pass filtering the first order diffracted beam into a plurality of wavelengths, a spectrally- and spatially-resolved quantitative phase image of the specimen is obtained.
Original languageEnglish (US)
U.S. patent number8837045
Filing date2/25/13
StatePublished - Sep 16 2014


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