Abstract
A microscope and methods for obtaining a phase image of a substantially transparent specimen. Light collected from a specimen illuminated by a temporally incoherent source is diffracted into a first order and either the zeroth or first order is low-pass filtered in a Fourier transform plane before the orders are recombined at a focal plane detector. By low pass filtering the first order diffracted beam into a plurality of wavelengths, a spectrally- and spatially-resolved quantitative phase image of the specimen is obtained.
Original language | English (US) |
---|---|
U.S. patent number | 8837045 |
Filing date | 2/25/13 |
State | Published - Sep 16 2014 |