Diffraction of evanescent waves and nanomechanical displacement detection

Devrez M. Karabacak; Kamil L. Ekinci; Choon How Gan; Gregory J. Gbur; M. Selim Ünlü; Stephen B. Ippolito; Bennett B. Goldberg; P. Scott Carney

doi:10.1364/OL.32.001881

Diffraction of evanescent waves and nanomechanical displacement detection

Devrez M. Karabacak, Kamil L. Ekinci, Choon How Gan, Gregory J. Gbur, M. Selim Ünlü, Stephen B. Ippolito, Bennett B. Goldberg, P. Scott Carney

Research output: Contribution to journal › Article › peer-review

Abstract

Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed approach is studied using diffraction theory of evanescent waves. Diffraction theory results are compared with numerical simulations.

Original language	English (US)
Pages (from-to)	1881-1883
Number of pages	3
Journal	Optics Letters
Volume	32
Issue number	13
DOIs	https://doi.org/10.1364/OL.32.001881
State	Published - Jul 1 2007
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

Online availability

10.1364/OL.32.001881

Library availability

Discover UIUC Full Text

Cite this

@article{2bbb98eaeffe4f2984adcad35d882809,

title = "Diffraction of evanescent waves and nanomechanical displacement detection",

abstract = "Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed approach is studied using diffraction theory of evanescent waves. Diffraction theory results are compared with numerical simulations.",

author = "Karabacak, {Devrez M.} and Ekinci, {Kamil L.} and Gan, {Choon How} and Gbur, {Gregory J.} and {\"U}nl{\"u}, {M. Selim} and Ippolito, {Stephen B.} and Goldberg, {Bennett B.} and Carney, {P. Scott}",

year = "2007",

month = jul,

day = "1",

doi = "10.1364/OL.32.001881",

language = "English (US)",

volume = "32",

pages = "1881--1883",

journal = "Optics Letters",

issn = "0146-9592",

publisher = "The Optical Society",

number = "13",

}

TY - JOUR

T1 - Diffraction of evanescent waves and nanomechanical displacement detection

AU - Karabacak, Devrez M.

AU - Ekinci, Kamil L.

AU - Gan, Choon How

AU - Gbur, Gregory J.

AU - Ünlü, M. Selim

AU - Ippolito, Stephen B.

AU - Goldberg, Bennett B.

AU - Carney, P. Scott

PY - 2007/7/1

Y1 - 2007/7/1

N2 - Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed approach is studied using diffraction theory of evanescent waves. Diffraction theory results are compared with numerical simulations.

AB - Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed approach is studied using diffraction theory of evanescent waves. Diffraction theory results are compared with numerical simulations.

UR - http://www.scopus.com/inward/record.url?scp=39749088286&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=39749088286&partnerID=8YFLogxK

U2 - 10.1364/OL.32.001881

DO - 10.1364/OL.32.001881

M3 - Article

C2 - 17603601

AN - SCOPUS:39749088286

SN - 0146-9592

VL - 32

SP - 1881

EP - 1883

JO - Optics Letters

JF - Optics Letters

IS - 13

ER -

Diffraction of evanescent waves and nanomechanical displacement detection

Abstract

ASJC Scopus subject areas

Online availability

Library availability

Related links

Fingerprint

Cite this