Dielectrophoretic tweezers for examining particle-surface interactions within microfluidic devices

Sang Woo Lee; Haibo Li; Rashid Bashir

doi:10.1063/1.2744483

Dielectrophoretic tweezers for examining particle-surface interactions within microfluidic devices

Sang Woo Lee, Haibo Li, Rashid Bashir

Research output: Contribution to journal › Article › peer-review

Abstract

The authors present dielectrophoresis (DEP)-based tweezers that can be used to characterize the interactions between a particle and the surface it is attached to, within a microfluidic device. As a proof of concept, 5.4 μm polystyrene beads functionalized by carboxyl group were attached on a bare and poly-L-lysine functionalized oxide surface. Negative dielectrophoresis force was generated using interdigitated electrodes and the peak dielectrophoresis voltage where the beads were repelled away from the surface was used to characterize the strength of interaction between the particle and the surface. Electric field and DEP force calculation were used to corroborate the measured results.

Original language	English (US)
Article number	223902
Journal	Applied Physics Letters
Volume	90
Issue number	22
DOIs	https://doi.org/10.1063/1.2744483
State	Published - 2007
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2744483

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@article{807e679a8bc14458a0792e9c20c38dbc,

title = "Dielectrophoretic tweezers for examining particle-surface interactions within microfluidic devices",

abstract = "The authors present dielectrophoresis (DEP)-based tweezers that can be used to characterize the interactions between a particle and the surface it is attached to, within a microfluidic device. As a proof of concept, 5.4 μm polystyrene beads functionalized by carboxyl group were attached on a bare and poly-L-lysine functionalized oxide surface. Negative dielectrophoresis force was generated using interdigitated electrodes and the peak dielectrophoresis voltage where the beads were repelled away from the surface was used to characterize the strength of interaction between the particle and the surface. Electric field and DEP force calculation were used to corroborate the measured results.",

author = "Lee, {Sang Woo} and Haibo Li and Rashid Bashir",

year = "2007",

doi = "10.1063/1.2744483",

language = "English (US)",

volume = "90",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "22",

}

TY - JOUR

T1 - Dielectrophoretic tweezers for examining particle-surface interactions within microfluidic devices

AU - Lee, Sang Woo

AU - Li, Haibo

AU - Bashir, Rashid

PY - 2007

Y1 - 2007

N2 - The authors present dielectrophoresis (DEP)-based tweezers that can be used to characterize the interactions between a particle and the surface it is attached to, within a microfluidic device. As a proof of concept, 5.4 μm polystyrene beads functionalized by carboxyl group were attached on a bare and poly-L-lysine functionalized oxide surface. Negative dielectrophoresis force was generated using interdigitated electrodes and the peak dielectrophoresis voltage where the beads were repelled away from the surface was used to characterize the strength of interaction between the particle and the surface. Electric field and DEP force calculation were used to corroborate the measured results.

AB - The authors present dielectrophoresis (DEP)-based tweezers that can be used to characterize the interactions between a particle and the surface it is attached to, within a microfluidic device. As a proof of concept, 5.4 μm polystyrene beads functionalized by carboxyl group were attached on a bare and poly-L-lysine functionalized oxide surface. Negative dielectrophoresis force was generated using interdigitated electrodes and the peak dielectrophoresis voltage where the beads were repelled away from the surface was used to characterize the strength of interaction between the particle and the surface. Electric field and DEP force calculation were used to corroborate the measured results.

UR - http://www.scopus.com/inward/record.url?scp=34249896143&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34249896143&partnerID=8YFLogxK

U2 - 10.1063/1.2744483

DO - 10.1063/1.2744483

M3 - Article

AN - SCOPUS:34249896143

SN - 0003-6951

VL - 90

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 22

M1 - 223902

ER -

Dielectrophoretic tweezers for examining particle-surface interactions within microfluidic devices

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