Abstract
Room-temperature pseudodielectric function spectra 〈ε (ω) 〉 = 〈 ε1 (ω) 〉 +i 〈 ε2 (ω) 〉 of Alx Ga1-x Sb (0.00≤x≤0.39) alloys were measured from 1.5 to 6.0 eV by spectroscopic ellipsometry. Effects of surface overlayers on the measured spectra have been minimized as far as possible by performing in situ chemical etching on samples immediately before the measurements rather than correcting the measured data mathematically for the presence of overlayers. Analysis of second energy derivatives numerically calculated from the measured data yielded the critical-point energies of the E1, E1 + Δ1, E0′, E2, and E1′ interband transitions. Dependence of the critical-point energies on composition x is obtained.
Original language | English (US) |
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Article number | 104108 |
Journal | Journal of Applied Physics |
Volume | 98 |
Issue number | 10 |
DOIs | |
State | Published - Nov 15 2005 |
ASJC Scopus subject areas
- General Physics and Astronomy