@inproceedings{e557157026fb4414b27f66779c9577bf,
title = "Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source",
abstract = "The Advanced Light Source (ALS) is a third-generation synchrotron X-ray source that operates as a user facility with more than 40 beamlines hosting over 2000 users per year. Synchrotron sources like the ALS provide high quality X-ray beams, with flux that is several orders of magnitude higher than lab-based sources. This is particularly advantageous for dynamic applications because it allows for high-speed, high-resolution imaging and microscale tomography. The hard X-ray beamline 8.3.2 at the Advanced Light Source enables imaging of samples at high temperatures and pressures, with mechanical loading and other realistic conditions using environmental test cells. These test cells enable experimental observation of samples undergoing dynamic microstructural changes in-situ. We present recent instrumentation developments that allow for continuous tomography with scan rates approaching 1 Hz per 3D image. In addition, our use of iterative reconstruction techniques allows for improved image quality despite fewer images and low exposure times used during fast tomography compared to traditional Fourier reconstruction methods.",
keywords = "X-ray, X-ray micro-Tomography, micro-tomography, synchrotron",
author = "Barnard, {Harold S.} and MacDowell, {A. A.} and Parkinson, {D. Y.} and Venkatakrishnan, {S. V.} and F. Panerai and Mansour, {N. N.}",
note = "Publisher Copyright: {\textcopyright} Copyright 2016 SPIE.; Developments in X-Ray Tomography X ; Conference date: 29-08-2016 Through 31-08-2016",
year = "2016",
doi = "10.1117/12.2238305",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Ge Wang and Stock, {Stuart R.} and Bert Muller",
booktitle = "Developments in X-Ray Tomography X",
}