Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source

Harold S. Barnard, A. A. MacDowell, D. Y. Parkinson, S. V. Venkatakrishnan, F. Panerai, N. N. Mansour

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Advanced Light Source (ALS) is a third-generation synchrotron X-ray source that operates as a user facility with more than 40 beamlines hosting over 2000 users per year. Synchrotron sources like the ALS provide high quality X-ray beams, with flux that is several orders of magnitude higher than lab-based sources. This is particularly advantageous for dynamic applications because it allows for high-speed, high-resolution imaging and microscale tomography. The hard X-ray beamline 8.3.2 at the Advanced Light Source enables imaging of samples at high temperatures and pressures, with mechanical loading and other realistic conditions using environmental test cells. These test cells enable experimental observation of samples undergoing dynamic microstructural changes in-situ. We present recent instrumentation developments that allow for continuous tomography with scan rates approaching 1 Hz per 3D image. In addition, our use of iterative reconstruction techniques allows for improved image quality despite fewer images and low exposure times used during fast tomography compared to traditional Fourier reconstruction methods.

Original languageEnglish (US)
Title of host publicationDevelopments in X-Ray Tomography X
EditorsGe Wang, Stuart R. Stock, Bert Muller
PublisherSPIE
ISBN (Electronic)9781510603257
DOIs
StatePublished - 2016
Externally publishedYes
EventDevelopments in X-Ray Tomography X - San Diego, United States
Duration: Aug 29 2016Aug 31 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9967
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceDevelopments in X-Ray Tomography X
CountryUnited States
CitySan Diego
Period8/29/168/31/16

Keywords

  • X-ray
  • X-ray micro-Tomography
  • micro-tomography
  • synchrotron

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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