Development progress of the Materials Analysis and Particle Probe

M. Lucia, R. Kaita, R. Majeski, F. Bedoya, J. P. Allain, D. P. Boyle, J. C. Schmitt, D. A St Onge

Research output: Research - peer-reviewArticle

Abstract

The Materials Analysis and Particle Probe (MAPP) is a compact in vacuo surface science diagnostic, designed to provide in situ surface characterization of plasma facing components in a tokamak environment. MAPP has been implemented for operation on the Lithium Tokamak Experiment at Princeton Plasma Physics Laboratory (PPPL), where all control and analysis systems are currently under development for full remote operation. Control systems include vacuum management, instrument power, and translational/rotational probe drive. Analysis systems include onboard Langmuir probes and all components required for x-ray photoelectron spectroscopy, low-energy ion scattering spectroscopy, direct recoil spectroscopy, and thermal desorption spectroscopy surface analysis techniques.

LanguageEnglish (US)
Article number11D835
JournalReview of Scientific Instruments
Volume85
Issue number11
DOIs
StatePublished - 2014

Fingerprint

probes
spectroscopy
Spectroscopy
Plasmas
plasma physics
systems analysis
ion scattering
electrostatic probes
x ray spectroscopy
lithium
desorption
photoelectron spectroscopy
vacuum
energy
Thermal desorption spectroscopy
Langmuir probes
Surface analysis
Photoelectron spectroscopy
Physics
Vacuum

ASJC Scopus subject areas

  • Instrumentation

Cite this

Lucia, M., Kaita, R., Majeski, R., Bedoya, F., Allain, J. P., Boyle, D. P., ... Onge, D. A. S. (2014). Development progress of the Materials Analysis and Particle Probe. Review of Scientific Instruments, 85(11), [11D835]. DOI: 10.1063/1.4890257

Development progress of the Materials Analysis and Particle Probe. / Lucia, M.; Kaita, R.; Majeski, R.; Bedoya, F.; Allain, J. P.; Boyle, D. P.; Schmitt, J. C.; Onge, D. A St.

In: Review of Scientific Instruments, Vol. 85, No. 11, 11D835, 2014.

Research output: Research - peer-reviewArticle

Lucia, M, Kaita, R, Majeski, R, Bedoya, F, Allain, JP, Boyle, DP, Schmitt, JC & Onge, DAS 2014, 'Development progress of the Materials Analysis and Particle Probe' Review of Scientific Instruments, vol 85, no. 11, 11D835. DOI: 10.1063/1.4890257
Lucia M, Kaita R, Majeski R, Bedoya F, Allain JP, Boyle DP et al. Development progress of the Materials Analysis and Particle Probe. Review of Scientific Instruments. 2014;85(11). 11D835. Available from, DOI: 10.1063/1.4890257
Lucia, M. ; Kaita, R. ; Majeski, R. ; Bedoya, F. ; Allain, J. P. ; Boyle, D. P. ; Schmitt, J. C. ; Onge, D. A St. / Development progress of the Materials Analysis and Particle Probe. In: Review of Scientific Instruments. 2014 ; Vol. 85, No. 11.
@article{c38aa99eb2a54d50a684092e9855ed78,
title = "Development progress of the Materials Analysis and Particle Probe",
abstract = "The Materials Analysis and Particle Probe (MAPP) is a compact in vacuo surface science diagnostic, designed to provide in situ surface characterization of plasma facing components in a tokamak environment. MAPP has been implemented for operation on the Lithium Tokamak Experiment at Princeton Plasma Physics Laboratory (PPPL), where all control and analysis systems are currently under development for full remote operation. Control systems include vacuum management, instrument power, and translational/rotational probe drive. Analysis systems include onboard Langmuir probes and all components required for x-ray photoelectron spectroscopy, low-energy ion scattering spectroscopy, direct recoil spectroscopy, and thermal desorption spectroscopy surface analysis techniques.",
author = "M. Lucia and R. Kaita and R. Majeski and F. Bedoya and Allain, {J. P.} and Boyle, {D. P.} and Schmitt, {J. C.} and Onge, {D. A St}",
year = "2014",
doi = "10.1063/1.4890257",
volume = "85",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "11",

}

TY - JOUR

T1 - Development progress of the Materials Analysis and Particle Probe

AU - Lucia,M.

AU - Kaita,R.

AU - Majeski,R.

AU - Bedoya,F.

AU - Allain,J. P.

AU - Boyle,D. P.

AU - Schmitt,J. C.

AU - Onge,D. A St

PY - 2014

Y1 - 2014

N2 - The Materials Analysis and Particle Probe (MAPP) is a compact in vacuo surface science diagnostic, designed to provide in situ surface characterization of plasma facing components in a tokamak environment. MAPP has been implemented for operation on the Lithium Tokamak Experiment at Princeton Plasma Physics Laboratory (PPPL), where all control and analysis systems are currently under development for full remote operation. Control systems include vacuum management, instrument power, and translational/rotational probe drive. Analysis systems include onboard Langmuir probes and all components required for x-ray photoelectron spectroscopy, low-energy ion scattering spectroscopy, direct recoil spectroscopy, and thermal desorption spectroscopy surface analysis techniques.

AB - The Materials Analysis and Particle Probe (MAPP) is a compact in vacuo surface science diagnostic, designed to provide in situ surface characterization of plasma facing components in a tokamak environment. MAPP has been implemented for operation on the Lithium Tokamak Experiment at Princeton Plasma Physics Laboratory (PPPL), where all control and analysis systems are currently under development for full remote operation. Control systems include vacuum management, instrument power, and translational/rotational probe drive. Analysis systems include onboard Langmuir probes and all components required for x-ray photoelectron spectroscopy, low-energy ion scattering spectroscopy, direct recoil spectroscopy, and thermal desorption spectroscopy surface analysis techniques.

UR - http://www.scopus.com/inward/record.url?scp=84905492683&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84905492683&partnerID=8YFLogxK

U2 - 10.1063/1.4890257

DO - 10.1063/1.4890257

M3 - Article

VL - 85

JO - Review of Scientific Instruments

T2 - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 11

M1 - 11D835

ER -