Development progress of the Materials Analysis and Particle Probe

M. Lucia; R. Kaita; R. Majeski; F. Bedoya; J. P. Allain; D. P. Boyle; J. C. Schmitt; D. A.St Onge

doi:10.1063/1.4890257

Development progress of the Materials Analysis and Particle Probe

M. Lucia, R. Kaita, R. Majeski, F. Bedoya, J. P. Allain, D. P. Boyle, J. C. Schmitt, D. A.St Onge

Nuclear, Plasma, and Radiological Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

The Materials Analysis and Particle Probe (MAPP) is a compact in vacuo surface science diagnostic, designed to provide in situ surface characterization of plasma facing components in a tokamak environment. MAPP has been implemented for operation on the Lithium Tokamak Experiment at Princeton Plasma Physics Laboratory (PPPL), where all control and analysis systems are currently under development for full remote operation. Control systems include vacuum management, instrument power, and translational/rotational probe drive. Analysis systems include onboard Langmuir probes and all components required for x-ray photoelectron spectroscopy, low-energy ion scattering spectroscopy, direct recoil spectroscopy, and thermal desorption spectroscopy surface analysis techniques.

Original language	English (US)
Article number	11D835
Journal	Review of Scientific Instruments
Volume	85
Issue number	11
DOIs	https://doi.org/10.1063/1.4890257
State	Published - Nov 2014

ASJC Scopus subject areas

Instrumentation

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10.1063/1.4890257

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AU - Kaita, R.

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AU - Bedoya, F.

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AU - Boyle, D. P.

AU - Schmitt, J. C.

AU - Onge, D. A.St

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AB - The Materials Analysis and Particle Probe (MAPP) is a compact in vacuo surface science diagnostic, designed to provide in situ surface characterization of plasma facing components in a tokamak environment. MAPP has been implemented for operation on the Lithium Tokamak Experiment at Princeton Plasma Physics Laboratory (PPPL), where all control and analysis systems are currently under development for full remote operation. Control systems include vacuum management, instrument power, and translational/rotational probe drive. Analysis systems include onboard Langmuir probes and all components required for x-ray photoelectron spectroscopy, low-energy ion scattering spectroscopy, direct recoil spectroscopy, and thermal desorption spectroscopy surface analysis techniques.

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Development progress of the Materials Analysis and Particle Probe

Abstract

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