Development of fluorescent probes for x-ray microscopy

M. M. Moronne, C. Larabell, P. R. Selvin, A. I. von Brenndorff

Research output: Contribution to conferencePaperpeer-review

Abstract

Recent results demonstrating the feasibility of developing x-ray resistant fluorescent probes based on lanthanides linked to secondary antibodies and other probe molecules are reported. Using scanning x-ray microscope at the National Synchrotron Light Source equipped with a low noise, high efficiency photo-avalanche diode detector for visible light single photon counting, it is demonstrated that the labels based on terbium and europium chelates continue to yield useful luminescence even after 1010 rad doses of 31.5 angstroms soft x-rays.

Original languageEnglish (US)
Pages48-49
Number of pages2
StatePublished - 1994
Externally publishedYes
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

ASJC Scopus subject areas

  • Engineering(all)

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