Development and application of a MEMS-based in Situ TEM straining device for ultra-fine grained metallic systems

K. Hattar, J. Han, M Taher A Saif, I. M. Robertson

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)50-51
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Sep 24 2004

ASJC Scopus subject areas

  • Instrumentation

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