| Original language | English (US) |
|---|---|
| Pages (from-to) | 50-51 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 10 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - 2004 |
ASJC Scopus subject areas
- Instrumentation
Development and application of a MEMS-based in Situ TEM straining device for ultra-fine grained metallic systems
K. Hattar, J. Han, M Taher A Saif, I. M. Robertson
Research output: Contribution to journal › Article › peer-review