Development and application of a MEMS-based in Situ TEM straining device for ultra-fine grained metallic systems

K. Hattar, J. Han, M Taher A Saif, I. M. Robertson

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)50-51
Number of pages2
JournalMicroscopy and Microanalysis
Volume10
Issue numberSUPPL. 2
DOIs
StatePublished - Sep 24 2004

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microelectromechanical systems
MEMS
Transmission electron microscopy
transmission electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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Development and application of a MEMS-based in Situ TEM straining device for ultra-fine grained metallic systems. / Hattar, K.; Han, J.; Saif, M Taher A; Robertson, I. M.

In: Microscopy and Microanalysis, Vol. 10, No. SUPPL. 2, 24.09.2004, p. 50-51.

Research output: Contribution to journalArticle

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