Fingerprint
Dive into the research topics of 'Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: A comparison study'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: A comparison study
Zhi Chen, Kangguo Cheng, Jinju Lee, Joseph W. Lyding, Karl Hess, Sundar Chetlur
Research output: Contribution to journal › Article › peer-review