Determination of the thermal conductivity tensor of the n 7 Aurivillius phase Sr 4Bi 4Ti 7O 24

M. A. Zurbuchen; D. G. Cahill; J. Schubert; Y. Jia; D. G. Schlom

doi:10.1063/1.4733616

Determination of the thermal conductivity tensor of the n 7 Aurivillius phase Sr ₄Bi ₄Ti ₇O ₂₄

M. A. Zurbuchen, D. G. Cahill, J. Schubert, Y. Jia, D. G. Schlom

Research output: Contribution to journal › Article › peer-review

Abstract

A challenge in the preparation of advanced materials that exist only as thin films is to establish their properties, particularly when the materials are of low symmetry or the tensor properties of interest are of high rank. Using Sr ₄Bi ₄Ti ₇O ₂₄ as an example, we show how the preparation of oriented epitaxial films of multiple orientations enables the thermal conductivity tensor of this tetragonal material with a c-axis length of 64.7 Å to be measured. The thermal conductivity tensor coefficients k ₃₃ 1.10 W m ^-1 K ^-1 and k ₁₁ k ₂₂ 1.80 W m ^-1 K ^-1 were determined by growing epitaxial Sr ₄Bi ₄Ti ₇O ₂₄ films on (100), (110), and (111) SrTiO ₃ substrates.

Original language	English (US)
Article number	021904
Journal	Applied Physics Letters
Volume	101
Issue number	2
DOIs	https://doi.org/10.1063/1.4733616
State	Published - Jul 9 2012

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Determination of the thermal conductivity tensor of the n 7 Aurivillius phase Sr 4Bi 4Ti 7O 24 ",

abstract = "A challenge in the preparation of advanced materials that exist only as thin films is to establish their properties, particularly when the materials are of low symmetry or the tensor properties of interest are of high rank. Using Sr 4Bi 4Ti 7O 24 as an example, we show how the preparation of oriented epitaxial films of multiple orientations enables the thermal conductivity tensor of this tetragonal material with a c-axis length of 64.7 {\AA} to be measured. The thermal conductivity tensor coefficients k 33 1.10 W m -1 K -1 and k 11 k 22 1.80 W m -1 K -1 were determined by growing epitaxial Sr 4Bi 4Ti 7O 24 films on (100), (110), and (111) SrTiO 3 substrates.",

author = "Zurbuchen, {M. A.} and Cahill, {D. G.} and J. Schubert and Y. Jia and Schlom, {D. G.}",

note = "Funding Information: This work was supported by the Defense Advanced Research Projects Agency (DARPA) and the U.S. Army Aviation and Missile Research, Development, and Engineering Center (AMRDEC). D.G.C. acknowledges support of the Air Force Office of Scientific Research MURI FA9550-08-1-0407. Sample preparation was performed by the UCLA Nanoelectronics Research Facility, and microscopy at the UCLA California Nanosystems Institute{\textquoteright}s (CNSI{\textquoteright}s) Electron Imaging Center for Nanomachines (EICN).",

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doi = "10.1063/1.4733616",

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AU - Zurbuchen, M. A.

AU - Cahill, D. G.

AU - Schubert, J.

AU - Jia, Y.

AU - Schlom, D. G.

N1 - Funding Information: This work was supported by the Defense Advanced Research Projects Agency (DARPA) and the U.S. Army Aviation and Missile Research, Development, and Engineering Center (AMRDEC). D.G.C. acknowledges support of the Air Force Office of Scientific Research MURI FA9550-08-1-0407. Sample preparation was performed by the UCLA Nanoelectronics Research Facility, and microscopy at the UCLA California Nanosystems Institute’s (CNSI’s) Electron Imaging Center for Nanomachines (EICN).

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N2 - A challenge in the preparation of advanced materials that exist only as thin films is to establish their properties, particularly when the materials are of low symmetry or the tensor properties of interest are of high rank. Using Sr 4Bi 4Ti 7O 24 as an example, we show how the preparation of oriented epitaxial films of multiple orientations enables the thermal conductivity tensor of this tetragonal material with a c-axis length of 64.7 Å to be measured. The thermal conductivity tensor coefficients k 33 1.10 W m -1 K -1 and k 11 k 22 1.80 W m -1 K -1 were determined by growing epitaxial Sr 4Bi 4Ti 7O 24 films on (100), (110), and (111) SrTiO 3 substrates.

AB - A challenge in the preparation of advanced materials that exist only as thin films is to establish their properties, particularly when the materials are of low symmetry or the tensor properties of interest are of high rank. Using Sr 4Bi 4Ti 7O 24 as an example, we show how the preparation of oriented epitaxial films of multiple orientations enables the thermal conductivity tensor of this tetragonal material with a c-axis length of 64.7 Å to be measured. The thermal conductivity tensor coefficients k 33 1.10 W m -1 K -1 and k 11 k 22 1.80 W m -1 K -1 were determined by growing epitaxial Sr 4Bi 4Ti 7O 24 films on (100), (110), and (111) SrTiO 3 substrates.

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Determination of the thermal conductivity tensor of the n 7 Aurivillius phase Sr ₄Bi ₄Ti ₇O ₂₄

Abstract

ASJC Scopus subject areas

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