Determination of reflectivity curves of multilayer neutron monochromators

Mihai Popovici, Brent J. Heuser, W. B. Yelon, John E. Keem

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The technique of measuring neutron multilayer monochromator reflectivities by double diffraction rocking curves is discussed. Two problems encountered are deposition induced curvature of multilayer support and lateral variation of layer spacing. Transmitted rocking curves were measured with a narrow detector in an effort to understand these specific problems. General formulae for interpretation of such rocking curves are derived and the methodology for determining relevant parameters is discussed. Measured reflectivities of 10 nm spacing Ni-Ti multilayer devices are presented. Consideration of support curvature and layer spacing variation is essential in understanding observed data.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Number of pages11
ISBN (Print)0819409111
StatePublished - 1992
Externally publishedYes
EventNeutron Optical Devices and Applications - San Diego, CA, USA
Duration: Jul 22 1992Jul 24 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherNeutron Optical Devices and Applications
CitySan Diego, CA, USA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Applied Mathematics
  • Electrical and Electronic Engineering
  • Computer Science Applications


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