Detecting minute amounts of nitrogen in GaNAs thin films using STEM and CBED

Keyphrases

• Gallium Arsenide 100%
• Transmission Electron Microscopy 100%
• GaNAs 100%
• Electron Diffraction 50%
• Electron Energy 50%
• Energy Dispersive X-ray Spectroscopy 50%
• Quantitative Convergent-beam Electron Diffraction 50%
• Electron Microscopy 50%
• Electron Microscopy Imaging 50%
• Composition Analysis 50%
• Chemical Analysis 50%
• Bandgap Engineering 50%
• Dark Field 50%
• Spectroscopic Techniques 50%
• Nitrogen N 50%
• Selected Area Electron Diffraction 50%
• GaAs Substrate 50%
• Electronic Energy Loss 50%
• Electron Microscopy Techniques 50%
• Field Transmission 50%
• N Content 50%
• Common Elements 50%
• Doped Thin Films 50%
• Strain Compensation 50%
• N-substitution 50%

Engineering

• Thin Films 100%
• Electron Energy 100%
• Transmissions 100%
• Gallium Arsenide 100%
• Engineering 50%
• Energy Engineering 50%
• Electron Diffraction 50%
• Convergent Beam Electron Diffraction 50%
• Energy Gap 50%
• Energy Dissipation 50%
• Gaas Substrate 50%
• Common Element 50%

Material Science

• Thin Films 100%
• Convergent Beam Electron Diffraction 100%
• Gallium Arsenide 100%
• Transmission Electron Microscopy 66%
• Electron Diffraction 33%
• Energy-Dispersive X-Ray Spectroscopy 33%
• Electron Microscopy 33%
• Selected Area Diffraction 33%
• Spectroscopy Technique 33%
• Microscopy 33%
• Chemical Composition Analysis 33%