Dependence of tracer diffusion on atomic size in amorphous Ni-Zr

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Tracer diffusion coefficients for several impurities and Ni self-atoms were measured in amorphous (a-) Ni50Zr50 at 573 K using secondary-ion-mass spectroscopy, Rutherford backscattering, and radioactive tracer methods. The results showed that atomic mobility in the a-Ni-Zr alloy depends strongly on atomic size, decreasing rapidly with increasing atomic radius. This diffusion behavior is similar to that in -Zr and -Ti and is suggestive of an interstitial-like mechanism of diffusion. The consequences of these results for solid-state amorphization transformations are discussed.

Original languageEnglish (US)
Pages (from-to)6533-6535
Number of pages3
JournalPhysical Review B
Issue number11
StatePublished - 1988

ASJC Scopus subject areas

  • Condensed Matter Physics


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