Denoising and deblurring of Fourier transform infrared spectroscopic imaging data

Tan H. Nguyen, Rohith K. Reddy, Michael J. Walsh, Matthew Schulmerich, Gabriel Popescu, Minh N. Do, Rohit Bhargava

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Fourier transform infrared (FT-IR) spectroscopic imaging is a powerful tool to obtain chemical information from images of heterogeneous, chemically diverse samples. Significant advances in instrumentation and data processing in the recent past have led to improved instrument design and relatively widespread use of FT-IR imaging, in a variety of systems ranging from biomedical tissue to polymer composites. Various techniques for improving signal to noise ratio (SNR), data collection time and spatial resolution have been proposed previously. In this paper we present an integrated framework that addresses all these factors comprehensively. We utilize the low-rank nature of the data and model the instrument point spread function to denoise data, and then simultaneously deblurr and estimate unknown information from images, using a Bayesian variational approach. We show that more spatial detail and improved image quality can be obtained using the proposed framework. The proposed technique is validated through experiments on a standard USAF target and on prostate tissue specimens.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Computational Imaging X
DOIs
StatePublished - 2012
EventComputational Imaging X - Burlingame, CA, United States
Duration: Jan 23 2012Jan 24 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8296
ISSN (Print)0277-786X

Other

OtherComputational Imaging X
CountryUnited States
CityBurlingame, CA
Period1/23/121/24/12

Keywords

  • deconvolution
  • FT-IR spectroscopic imaging
  • linear mixture model
  • mid-infrared spectroscopy
  • optics modeling

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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