@article{f872c7b2c65e4c2cbaa18c262697c858,
title = "Deformation Defects Characterization in Short-range Ordered CrCoNi using Fast Electron Detectors and 4D-STEM",
author = "Kaijun Yin and Hsiao, {Haw Wen} and Rui Feng and Liaw, {Peter K.} and Zuo, {Jian Min}",
year = "2023",
month = jul,
day = "22",
doi = "10.1093/micmic/ozad067.113",
language = "English (US)",
volume = "29",
pages = "251--253",
journal = "Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "1",
}