Defect production in ion-irradiated aluminum

R. S. Averback, R. Benedek, K. L. Merkle, J. Sprinkle, L. J. Thompson

Research output: Contribution to journalArticle

Abstract

Residual-resistivity measurements on ion-irradiated thin films are used to study defect production in aluminum. The energy and mass dependences of damage rates indicate that defect production efficiency (relative to the modified Kinchin-Pease relation) strongly decreases at recoil energies between 5 and 10 keV. At high energy the efficiency approaches an asymptotic value of 0.5. These results are similar to those observed in copper and silver. Binary-collision simulations were performed for copper, silver and aluminum to investigate the relationship of cascade structure to defect production efficiency. The mechanism primarily responsible for the reduced defect production efficiency in cascades in aluminum is thought to be the subthreshold recombination of Frenkel pairs during the thermal-spike phase of the cascade.

Original languageEnglish (US)
Pages (from-to)211-218
Number of pages8
JournalJournal of Nuclear Materials
Volume113
Issue number2-3
DOIs
StatePublished - Jan 2 1983
Externally publishedYes

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering

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  • Cite this

    Averback, R. S., Benedek, R., Merkle, K. L., Sprinkle, J., & Thompson, L. J. (1983). Defect production in ion-irradiated aluminum. Journal of Nuclear Materials, 113(2-3), 211-218. https://doi.org/10.1016/0022-3115(83)90145-9