Measurements have been made of the change in residual electrical resistivity in thin-film specimens of Cu and Ag induced by light-ion irradiations (H,D,3He, 4He) below 10 K in the energy range 15-40 keV. The number of Frenkel pairs created per incident ion was deduced and compared with theoretical predictions. The efficiency factor (ratio of experimental to theoretical value) was found to decrease from ∼1 to 0.7 (0.9 to 0.65) for Cu (Ag) as the recoil spectrum was shifted to higher energies by increasing the projectile mass and/or energy.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)