Defect production and electronic stopping for light ions in metals

R. S. Averback; R. Benedek; K. L. Merkle; L. J. Thompson

doi:10.1016/0022-3115(79)90538-5

Defect production and electronic stopping for light ions in metals

R. S. Averback, R. Benedek, K. L. Merkle, L. J. Thompson

Research output: Contribution to journal › Article › peer-review

Abstract

A method for determining effective electronic stopping powers in metals is presented. The method involves measuring damage rates in thin films as a function of ion energy. The experimental results are compared with predictions based on Monte Carlo computer simulations. Results are presented for H, D, He, and Li projectiles on Cu, Ag, and Ni. The implication of these results for defect production is discussed.

Original language	English (US)
Pages (from-to)	503-507
Number of pages	5
Journal	Journal of Nuclear Materials
Volume	85-86
Issue number	PART 1
DOIs	https://doi.org/10.1016/0022-3115(79)90538-5
State	Published - Dec 2 1979
Externally published	Yes

ASJC Scopus subject areas

Nuclear and High Energy Physics
Materials Science(all)
Nuclear Energy and Engineering

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10.1016/0022-3115(79)90538-5

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abstract = "A method for determining effective electronic stopping powers in metals is presented. The method involves measuring damage rates in thin films as a function of ion energy. The experimental results are compared with predictions based on Monte Carlo computer simulations. Results are presented for H, D, He, and Li projectiles on Cu, Ag, and Ni. The implication of these results for defect production is discussed.",

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AU - Averback, R. S.

AU - Benedek, R.

AU - Merkle, K. L.

AU - Thompson, L. J.

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Y1 - 1979/12/2

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AB - A method for determining effective electronic stopping powers in metals is presented. The method involves measuring damage rates in thin films as a function of ion energy. The experimental results are compared with predictions based on Monte Carlo computer simulations. Results are presented for H, D, He, and Li projectiles on Cu, Ag, and Ni. The implication of these results for defect production is discussed.

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Defect production and electronic stopping for light ions in metals

Abstract

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