De-embedding of port discontinuities in full-wave CAD models of multi-port circuits

V. I. Okhmatovski, J. Morsey, A. C. Cangellaris

Research output: Contribution to journalConference article

Abstract

Systematic numerical methodology is proposed for accurate de-embedding of the port discontinuities in fullwave models of the unbounded multi-port circuits. The approach is based on the idea of short-open calibration (SOC). The latter being a numerical analog of the experimental TRL-technique provides a consistent removal of the feed networks in a wide range of frequencies. The treatment of multi-port topologies is achieved through the continuation of the original scalar SOC into the vector space. The new vector short-open calibration (VSOC) method provides a seamless interface with the integral equation based method of moments (MoM) solvers. Owing to the distributed nature of the microwave circuits the method allows for a substantial flexibility in the choice of the excitation mechanisms. Such commonly used MoM driving schemes as the ports locally backed up by the vertical wall, ungrounded-internal differential ports or via-mounted ports can be accurately de-embedded within the framework of the VSOC.

Original languageEnglish (US)
Pages (from-to)303-306
Number of pages4
JournalIEEE MTT-S International Microwave Symposium Digest
Volume1
StatePublished - Aug 18 2003
Event2003 IEEE MTT-S International Microwave Symposium Digest - Philadelphia, PA, United States
Duration: Jun 8 2003Jun 13 2003

Fingerprint

computer aided design
embedding
Computer aided design
discontinuity
Calibration
Networks (circuits)
Method of moments
method of moments
Microwave circuits
Vector spaces
Integral equations
vector spaces
microwave circuits
Topology
integral equations
flexibility
topology
methodology
analogs
scalars

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

De-embedding of port discontinuities in full-wave CAD models of multi-port circuits. / Okhmatovski, V. I.; Morsey, J.; Cangellaris, A. C.

In: IEEE MTT-S International Microwave Symposium Digest, Vol. 1, 18.08.2003, p. 303-306.

Research output: Contribution to journalConference article

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