DC and RF characteristics of doped multichannel AlAs0.56Sb0.44/In0.53Ga0.47As field effect transistors with variable gate-lengths

D. C. Dumka, G. Cueva, H. Hier, O. A. Aina, I. Adesida

Research output: Contribution to journalArticlepeer-review

Abstract

Depletion-mode doped-channel field effect transistors (DCFETs) using AlAs0.56Sb0.44/In0.53Ga0.47 As heterostructure with multiple channels grown by molecular beam epitaxy (MBE) on InP substrate are presented. Devices with gate-lengths ranging from 0.2 μm to 1.0 μm have been fabricated. Three doped In0.53Ga0.47As channels separated by undoped AlAs0.56Sb0.44 layers are used for the devices. The devices exhibit unity current gain cut-off frequencies typically between 18 GHz and 73 GHz and corresponding maximum oscillation frequencies typically between 60 GHz and 160 GHz. The multiple channel approach results in wide linearity of dc and RF performance of the device.

Original languageEnglish (US)
Pages (from-to)5-7
Number of pages3
JournalIEEE Electron Device Letters
Volume22
Issue number1
DOIs
StatePublished - Jan 2001

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'DC and RF characteristics of doped multichannel AlAs0.56Sb0.44/In0.53Ga0.47As field effect transistors with variable gate-lengths'. Together they form a unique fingerprint.

Cite this