@article{bb1fda4346b14f21a743662408aa19ec,
title = "Data-driven reliability for datacenter hard disk drives",
author = "Alan Yang and Ghassami, {Amir Emad} and Elyse Rosenbaum and Negar Kiyavash",
note = "Funding Information: M&M is sponsored by the Microscopy Society of America, the Microanalysis Society, and the Microscopical Society of Canada. For more information, visit microscopy.org/MandM/2019. Funding Information: This work was funded in part by the NSF under CNS 16-24811 and the industry members of the CAEML I/UCRC. Funding Information: Rosenbaum, a Fellow of IEEE, has authored nearly 200 technical papers and has been an editor for IEEE Transactions on Device and Materials Reliability and IEEE Transactions on Electron Devices. She was the recipient of a Technical Excellence Award from the SRC, an NSF Career Award, an IBM Faculty Award, and the ESD Association{\textquoteright}s Industry Pioneer Recognition Award. Funding Information: Negar Kiyavash is a joint associate professor in the H. Milton Stewart School of Industrial & Systems Engineering (ISyE) and the School of Electrical and Computer Engineering (ECE) at Georgia Institute of Technology (Gatech). Prior to joining Gatech, she was a Willett Faculty Scholar and a joint associate professor of industrial and enterprise engineering (IE) and electrical and computer engineering (ECE) at the University of Illinois. Her research interests are in design and analysis of algorithms for network inference and security. She is a recipient of NSF Career and AFOSR YIP awards and the Illinois College of Engineering Dean{\textquoteright}s Award for Excellence in Research.",
year = "2019",
month = may,
language = "English (US)",
volume = "21",
pages = "18--20",
journal = "Electronic Device Failure Analysis",
issn = "1537-0755",
publisher = "ASM International",
number = "2",
}