Dark field Raman microscopy

Matthew V. Schulmerich, Rohith Reddy, Anil K. Kodali, Laura Jane Elgass, Krishnarao Tangella, Rohit Bhargava

Research output: Contribution to journalArticle

Abstract

Confocal Raman microscopy is often used for optical sectioning but is problematic when the sample plane of interest has a weak Raman cross-section/signal relative to areas that are out-of-focus. This is especially true for clinical samples in pathology, which consist of a thin tissue (∼5 μm) sample placed on a thick glass slide. Here, we recognize that the problem is the result of the extent of the illumination at the confocal plane being larger than the size of the sample and propose a dark field illumination scheme to efficiently reject substrate signals. The ability of several optical configurations in rejecting out-of-plane signal is investigated for two model systems: SU-8 photo resist over Teflon and SU-8 photo resist over polystyrene. The proposed reflective dark field approach, in which excitation converged to a focal point slightly above the focal plane of the collection optics, was found to be most effective in recording data from the sample. The proposed approach is validated by the rejection of substrate response (fluorescence) in spectra acquired from ∼4 μm of breast tissue on a glass microscope slide. The proposed approach is easy to implement on existing confocal systems, has a straightforward optimization in acquiring data, and is not expected to result in loss of lateral resolution in mapping experiments.

Original languageEnglish (US)
Pages (from-to)6273-6280
Number of pages8
JournalAnalytical chemistry
Volume82
Issue number14
DOIs
StatePublished - Jul 15 2010

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Microscopic examination
Lighting
Tissue
Glass
Data recording
Polystyrenes
Polytetrafluoroethylene
Pathology
Substrates
Optics
Microscopes
Fluorescence
Experiments

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

Schulmerich, M. V., Reddy, R., Kodali, A. K., Elgass, L. J., Tangella, K., & Bhargava, R. (2010). Dark field Raman microscopy. Analytical chemistry, 82(14), 6273-6280. https://doi.org/10.1021/ac1014194

Dark field Raman microscopy. / Schulmerich, Matthew V.; Reddy, Rohith; Kodali, Anil K.; Elgass, Laura Jane; Tangella, Krishnarao; Bhargava, Rohit.

In: Analytical chemistry, Vol. 82, No. 14, 15.07.2010, p. 6273-6280.

Research output: Contribution to journalArticle

Schulmerich, MV, Reddy, R, Kodali, AK, Elgass, LJ, Tangella, K & Bhargava, R 2010, 'Dark field Raman microscopy', Analytical chemistry, vol. 82, no. 14, pp. 6273-6280. https://doi.org/10.1021/ac1014194
Schulmerich MV, Reddy R, Kodali AK, Elgass LJ, Tangella K, Bhargava R. Dark field Raman microscopy. Analytical chemistry. 2010 Jul 15;82(14):6273-6280. https://doi.org/10.1021/ac1014194
Schulmerich, Matthew V. ; Reddy, Rohith ; Kodali, Anil K. ; Elgass, Laura Jane ; Tangella, Krishnarao ; Bhargava, Rohit. / Dark field Raman microscopy. In: Analytical chemistry. 2010 ; Vol. 82, No. 14. pp. 6273-6280.
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