@inproceedings{e0581142c69942a792d7cf56231342bc,
title = "Custom test chip for system-level ESD investinvestigations",
abstract = "A test-chip for monitoring soft failures is presented. Diagnostics include logic circuit upset detection, substrate potential latchup monitors, input glitch detectors, system Iddq monitors, and USB transmitters. Powered TLP testing and IEC61000-4-2 ESD produce different failures. Also, different failures are reported for mobile systems and those powered through grounded supplies.",
author = "Nicholas Thomson and Yang Xiu and Robert Mertens and Keel, {Min Sun} and Elyse Rosenbaum",
year = "2014",
month = nov,
day = "26",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
number = "November",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2014",
edition = "November",
note = "36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 ; Conference date: 07-09-2014 Through 12-09-2014",
}