Abstract
Electronic systems and components contain large numbers of elements and have a complex non-linear response to ESD; thus, passing ESD qualification on the first pass is unlikely to occur unless the robustness is verified by means of simulation prior to manufacturing. For component-level ESD verification, the primary challenge is in regards to computational efficiency; for system-level ESD verification, component and test bed modeling present major challenges.
| Original language | English (US) |
|---|---|
| Title of host publication | 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 333-336 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781479966707 |
| DOIs | |
| State | Published - Aug 3 2015 |
| Event | Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 - Taipei, Taiwan, Province of China Duration: May 25 2015 → May 29 2015 |
Publication series
| Name | 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 |
|---|
Other
| Other | Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 |
|---|---|
| Country | Taiwan, Province of China |
| City | Taipei |
| Period | 5/25/15 → 5/29/15 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Radiation
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Cite this
Rosenbaum, E., Meng, K. H., Xiu, Y., & Thomson, N. (2015). Current challenges in component-level and system-level ESD simulation. In 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 (pp. 333-336). [7175328] (2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APEMC.2015.7175328