@inproceedings{0a6252db46bf4dc9bbbdc5f61b072bc2,
title = "Current and future trend of energy/bit for high speed uncool optical links (50 Gb/s and 75°C)",
abstract = "VCSEL bandwidth is limited by slow e-h recombination lifetime nanosecond to ∼ 30 GHz (60Gb/s). The transistor laser (TL) has picosecond radiative recombination lifetime; thus, it will have modulation bandwidth higher than VCSELs toward 150 GHz to achieve 300 Gb/s error free transmission and low power operation of energy/bit toward 10 fJ/bit.",
author = "Milton Feng and Nick Holonyak and Junyi Qiu and Wang, {C. Y.}",
note = "Funding Information: Fig. 2(d) displays a plot of data/energy efficiency (Tb/J) as a function of data rate (Gb/s) for electrical and optical interconnects with different threshold current for VCSELs and TLs. The green circles (VCSELs) and blue circles (Oxide-VCSELs) represent published experimental results. The red circles (Microcavity-oxide VCSELs) are UIUC published results. In this plot, the electrical interconnect (copper line) is limited to 1Tb/J at 10 Gb/s. The VCSEL (ITH = 1 mA) based optical interconnect is limited to 2Tb/J @ 10 Gb/s and 0.7Tb/J @ 20 Gb/s. It shows 2x data/energy advantages over copper interconnect. The oxide-VCSELs with ITH = 0.4 mA based optical interconnect shows 7Tb/J @ 10 Gb/s which is 7x better than copper interconnect. The Microcavity-VCSELs with ITH = 0.2 mA demonstrate 20Tb/J @ 10 Gb/s which is 20x better than copper interconnects. However, the Microcavity VCSEL based optical interconnect is limited to lower efficiency of 1Tb/J @ 50 Gb/s data rate. Hence, there is a great need to innovate a VCTL to transmit data at a rate > 50Gb/s with an energy efficiency > 20Tb/J. (This work was supported in part by the Army Research Office under Grants W911NF-17-1-0112 and AFOSR under grants FA9550-15-1-0122); 2017 IEEE Photonics Society Summer Topicals Meeting Series, SUM 2017 ; Conference date: 10-07-2017 Through 12-07-2017",
year = "2017",
month = aug,
day = "17",
doi = "10.1109/PHOSST.2017.8012715",
language = "English (US)",
series = "Summer Topicals Meeting Series, SUM 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "191--192",
booktitle = "Summer Topicals Meeting Series, SUM 2017",
address = "United States",
}