Crystallographic characteristics of grain boundaries in dense yttria-stabilized zirconia

Lam Helmick, Shen J. Dillon, Kirk Gerdes, Randall Gemmen, Gregory S. Rohrer, Sridhar Seetharaman, Paul A. Salvador

Research output: Contribution to journalArticlepeer-review

Abstract

Grain-boundary plane, misorientation angle, grain size, and grain-boundary energy distributions were quantified using electron backscatter diffraction data for dense polycrystalline yttria-stabilized zirconia, to understand interfacial crystallography in solid oxide fuel cells. Tape-cast samples were sintered at 1450°C for 4 h and annealed for at least 100 h between 800°C and 1650°C. Distributions obtained from both three-dimensional (3D) reconstructions and stereological analyses of 2D sections demonstrated that the (100) boundary planes {(111)} have relative areas larger {smaller} than expected in a random distribution, and that the boundary plane distribution is inversely correlated to the boundary energy distribution.

Original languageEnglish (US)
Pages (from-to)1218-1228
Number of pages11
JournalInternational Journal of Applied Ceramic Technology
Volume8
Issue number5
DOIs
StatePublished - Sep 1 2011

ASJC Scopus subject areas

  • Ceramics and Composites
  • Condensed Matter Physics
  • Marketing
  • Materials Chemistry

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