Cryogenic cathodoluminescence from CuxAg1-xInSe 2 thin films

Angel R. Aquino, Angus A. Rockett, Scott A. Little, Sylvain Marsillac

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

CuxAg1-xInSe2 (CAIS) thin films were deposited by a hybrid magnetron sputtering/evaporation process over a range of x values. Cryogenic cathodoluminescence (CL) data was obtained from these thin films. Emission peaks were identified and spectrally-resolved images were recorded at these wavelengths. A power-dependent CL series was also recorded. Emissions were fairly uniform across the sample for AgInSe2 (AIS) (x=0). As x increased, the emission became less uniform both in intensity and in spectral components. AIS showed no significant difference between grain and grain boundary emission, while some grain boundaries in CAIS with x=0 showed higher emission intensity than the grains. No reduction in emission intensity was seen from topmost surface features in AIS, as opposed to CIS. Cu 0.6Ag0.4InSe2 showed the largest variation in emission from grain to grain, while CIS showed the largest variation in emission from grain to grain boundary.

Original languageEnglish (US)
Title of host publicationProgram - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Pages3386-3390
Number of pages5
DOIs
StatePublished - Dec 20 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: Jun 20 2010Jun 25 2010

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
CountryUnited States
CityHonolulu, HI
Period6/20/106/25/10

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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