CuxAg1-xInSe2 (CAIS) thin films were deposited by a hybrid magnetron sputtering/evaporation process over a range of x values. Cryogenic cathodoluminescence (CL) data was obtained from these thin films. Emission peaks were identified and spectrally-resolved images were recorded at these wavelengths. A power-dependent CL series was also recorded. Emissions were fairly uniform across the sample for AgInSe2 (AIS) (x=0). As x increased, the emission became less uniform both in intensity and in spectral components. AIS showed no significant difference between grain and grain boundary emission, while some grain boundaries in CAIS with x=0 showed higher emission intensity than the grains. No reduction in emission intensity was seen from topmost surface features in AIS, as opposed to CIS. Cu 0.6Ag0.4InSe2 showed the largest variation in emission from grain to grain, while CIS showed the largest variation in emission from grain to grain boundary.