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Cross-layer resilience in low-voltage digital systems: Key insights
Eric Cheng
, Jacob Abraham
, Pradip Bose
, Alper Buyuktosunoglu
, Keith Campbell
,
Deming Chen
, Cheng Yong Cher
, Hyungmin Cho
, Binh Le
, Klas Lilja
, Shahrzad Mirkhani
, Kevin Skadron
, Mircea Stan
, Lukasz Szafaryn
, Christos Vezyrtzis
, Subhasish Mitra
Electrical and Computer Engineering
Coordinated Science Lab
Information Trust Institute
Siebel School of Computing and Data Science
Research output
:
Chapter in Book/Report/Conference proceeding
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Conference contribution
Overview
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Keyphrases
Low Voltage
100%
Resilience
100%
Digital Systems
100%
Cross-layer Resilience
100%
Error Sources
33%
Resilient
33%
Cross-layer
33%
Hardware Failure
33%
Architecting
33%
Combined Technique
16%
Effective Rate of Protection
16%
Software Development Methodology
16%
Execution Time
16%
Large Space
16%
Power Energy
16%
Incorrect Conclusions
16%
Circuit Level Techniques
16%
Multiple Errors
16%
Low Energy Cost
16%
Design Cost
16%
Cost-effective Solution
16%
Logic Architecture
16%
Time-area
16%
Software Algorithms
16%
Digital System Design
16%
Computer Science
Digital System
100%
Resilience Technique
66%
Computer Hardware
66%
Software Technique
33%
Effective Solution
33%
Execution Time
33%
Level Technique
33%
Application Level
33%
Existing Architecture
33%
Incorrect Conclusion
33%
Software Architecture
33%