@article{fbb9435090814b9dae95ab591d087e8e,
title = "Critical current degradation in HTS wires due to cyclic mechanical strain",
abstract = "HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5 % and cycle numbers up to and beyond 10 4.",
keywords = "Critical current degradation, Cyclic strains, Electric devices, HTS wires",
author = "Ryan, {David T.} and Liang Li and Xianrui Huang and Bray, {J. W.} and Laskaris, {Evangelos T.} and Kiruba Sivasubramaniam and Gadre, {Aniruddha D.} and Fogarty, {James M.} and Harley, {E. J.} and A. Otto and {Den Ouden}, A.",
note = "Funding Information: Manuscript received October 9, 2004. This work was supported in part by the U.S. Department of Energy under Grant DE-FC36-02GO11100. D. T. Ryan, L. Li, X. Huang, J. W. Bray, E. T. Laskaris, K. Sivasubramaniam, and A. D. Gadre are with General Electric Global Research Center, Niskayuna, NY 12309, USA (e-mail: li@crd.ge.com). J. M Fogarty is with General Electric Energy, Schenectady, NY, USA. E. J. Harley and A. Otto are with American Superconductor, Westborough, MA. A. Den Ouden is with the Low Temperature Division, University of Twente, 7500 AE Enschede, The Netherlands. Digital Object Identifier 10.1109/TASC.2005.849392",
year = "2005",
month = jun,
doi = "10.1109/TASC.2005.849392",
language = "English (US)",
volume = "15",
pages = "3684--3687",
journal = "IEEE Transactions on Applied Superconductivity",
issn = "1051-8223",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2 PART III",
}