Critical current degradation in HTS wires due to cyclic mechanical strain

David T. Ryan, Liang Li, Xianrui Huang, J. W. Bray, Evangelos T. Laskaris, Kiruba Sivasubramaniam, Aniruddha D. Gadre, James M. Fogarty, E. J. Harley, A. Otto, A. Den Ouden

Research output: Contribution to journalArticlepeer-review

Abstract

HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5 % and cycle numbers up to and beyond 10 4.

Original languageEnglish (US)
Pages (from-to)3684-3687
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume15
Issue number2 PART III
DOIs
StatePublished - Jun 2005
Externally publishedYes

Keywords

  • Critical current degradation
  • Cyclic strains
  • Electric devices
  • HTS wires

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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