@inproceedings{32fdda1c060149028d8f75752d5f3da2,
title = "CrashTest'ing SWAT: Accurate, gate-level evaluation of symptom-based resiliency solutions",
abstract = "Current technology scaling is leading to increasingly fragile components, making hardware reliability a primary design consideration. Recently researchers have proposed low-cost reliability solutions that detect hardware faults through software-level symptom monitoring. SWAT (SoftWare Anomaly Treatment), one such solution, demonstrated with microarchitecture-level simulations that symptom-based solutions can provide high fault coverage and a low Silent Data Corruption (SDC) rate. However, more accurate evaluations are needed to validate such solutions for hardware faults in real-world processor designs. In this paper, we evaluate SWAT's symptom-based detectors on gate-level faults using an FPGA-based, full-system prototype. With this platform, we performed a gate-level accurate fault injection campaign of 51,630 fault injections in the OpenSPARC T1 core logic across five SPECInt 2000 benchmarks. With an overall SDC rate of 0.79\%, our results are comparable to previous microarchitecture-level evaluations of SWAT, demonstrating the effectiveness of symptom-based software detectors for permanent faults in real-world designs.",
author = "A. Pellegrini and R. Smolinski and L. Chen and X. Fu and Hari, \{S. K.S.\} and J. Jiang and Adve, \{S. V.\} and T. Austin and V. Bertacco",
year = "2012",
doi = "10.1109/date.2012.6176660",
language = "English (US)",
isbn = "9783981080186",
series = "Proceedings -Design, Automation and Test in Europe, DATE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1106--1109",
booktitle = "Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012",
address = "United States",
note = "15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012 ; Conference date: 12-03-2012 Through 16-03-2012",
}