Abstract
The surface diffusion of K on Pd〈111〉 has been studied with photoelectron emission microscopy (PEEM). It is shown that the method can be used to investigate diffusion in the full monolayer coverage region by calibrating brightness versus coverage in the PEEM image. In addition to a very fast diffusion stage at the lowest concentrations (< 0.05 monolayer (ML)), a local maximum in the diffusion coefficient at 0.5 ML was identified and correlated with the formation of the ordered (2 × 2) phase.
Original language | English (US) |
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Pages (from-to) | 764-770 |
Number of pages | 7 |
Journal | Surface Science |
Volume | 331-333 |
Issue number | PART A |
DOIs | |
State | Published - Jul 1 1995 |
Externally published | Yes |
Keywords
- Alkali metals
- Diffusion and migration
- Electron microscopy
- Low index single crystal surfaces
- Palladium
- Photoelectron emission
- Surface diffusion
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry