Count rates and structure factors in anomalous soft x-ray scattering from cuprate superconductors

P. Abbamonte, L. Venema, A. Rusydi, G. Logvenov, I. Bozovic, G. A. Sawatzky

Research output: Contribution to journalConference articlepeer-review

Abstract

It has recently been shown that x-ray diffraction from the doped holes in cuprates can be enhanced by 3-4 orders of magnitude by exploiting resonance effects in the oxygen K shell. This new type of anomalous scattering is direct way of probing ground state inhomogeneity in the mobile carrier liquid of high temperature superconductors. Here we describe a model which quantifies the relationship between experimental count rates and the structure factor for doped holes in this technique. We describe first efforts to detect inhomogeneity in thin films of La2CuO4+δ and report some peculiar observations. We attempt to offer some explanation.

Original languageEnglish (US)
Pages (from-to)60-64
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4811
DOIs
StatePublished - Dec 1 2002
Externally publishedYes
EventSuperconducting and Related Oxides: Physics and Nanoengineering V - Seattle, WA, United States
Duration: Jul 8 2002Jul 11 2002

Keywords

  • Anomalous x-ray scattering
  • Inhomogeneity
  • Stripes
  • Superconductivity
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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