Correlations between mapping spectroscopic ellipsometry and solar cell performance for the Study of nonuniformities in thin (0.7 μm) Cu(In 1-xGax)Se2 solar cells over large areas

Puruswottam Aryal, Dinesh Attygalle, Puja Pradhan, Abdel Rahman A. Ibdah, Krishna Aryal, N. J. Podraza, S. Marsillac, A. A. Rockett, R. W. Collins

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In the scale up from small area solar cells to large area production modules, it is important to understand the effects of macroscopic nonuniformities in basic properties on the ultimate performance of the devices. In this study, we have spatially correlated non-uniformities in thin-absorber (∼ 0.7 μm) CIGS [Cu(In1-xGax)Se2] based solar cells with the corresponding performance parameters of small area devices. Non-contacting spectroscopic ellipsometry (SE) mapping of constituent layers over a 10 cm × 10 cm area has been performed step by step during batch processing, providing CIGS composition, as well as bulk and surface roughness thickness maps for each layer of the device structure. After film stack preparation and mapping, an 18 × 9 array of 0.5-cm2-area solar cells was fabricated in order to establish a spatial correlation between the composition/ thicknesses and cell performance maps over the same area. This approach serves to characterize the inherent non-uniformities that occur during large-area, thin-layer deposition, and is uniquely suited for industrial application. In addition, given sufficient non-uniformity, correlations between layer properties, deduced by SE at different spatial points of a large area cell structure, and the solar cell performance at those points enables expeditious optimization. As an example of the application of this capability, we have demonstrated the feasibility of depositing efficient, verythin CIGS in a three stage process, designed to reduce materials cost and increase throughput of solar modules.

Original languageEnglish (US)
Title of host publication39th IEEE Photovoltaic Specialists Conference, PVSC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1685-1690
Number of pages6
ISBN (Print)9781479932993
DOIs
StatePublished - 2013
Externally publishedYes
Event39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States
Duration: Jun 16 2013Jun 21 2013

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/TerritoryUnited States
CityTampa, FL
Period6/16/136/21/13

Keywords

  • Ellipsometry
  • Gallium-based semiconductor materials
  • Photovoltaic cells
  • Thickness measurement

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

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