Correlating dislocation behavior with macroscopic mechanical properties directly in the TEM through use of a novel tensile test device

K. Hattar, J. J. Han, T. Saif, I. M. Robertson, D. M. Follstaedt, S. J. Hearne

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)932-933
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2006

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tensile tests
mechanical properties
Transmission electron microscopy
Mechanical properties
transmission electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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Correlating dislocation behavior with macroscopic mechanical properties directly in the TEM through use of a novel tensile test device. / Hattar, K.; Han, J. J.; Saif, T.; Robertson, I. M.; Follstaedt, D. M.; Hearne, S. J.

In: Microscopy and Microanalysis, Vol. 12, No. SUPPL. 2, 01.08.2006, p. 932-933.

Research output: Contribution to journalArticle

Hattar, K. ; Han, J. J. ; Saif, T. ; Robertson, I. M. ; Follstaedt, D. M. ; Hearne, S. J. / Correlating dislocation behavior with macroscopic mechanical properties directly in the TEM through use of a novel tensile test device. In: Microscopy and Microanalysis. 2006 ; Vol. 12, No. SUPPL. 2. pp. 932-933.
@article{64761215e3194cf0b8abc79623e36b48,
title = "Correlating dislocation behavior with macroscopic mechanical properties directly in the TEM through use of a novel tensile test device",
author = "K. Hattar and Han, {J. J.} and T. Saif and Robertson, {I. M.} and Follstaedt, {D. M.} and Hearne, {S. J.}",
year = "2006",
month = "8",
day = "1",
doi = "10.1017/S143192760606524X",
language = "English (US)",
volume = "12",
pages = "932--933",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",

}

TY - JOUR

T1 - Correlating dislocation behavior with macroscopic mechanical properties directly in the TEM through use of a novel tensile test device

AU - Hattar, K.

AU - Han, J. J.

AU - Saif, T.

AU - Robertson, I. M.

AU - Follstaedt, D. M.

AU - Hearne, S. J.

PY - 2006/8/1

Y1 - 2006/8/1

UR - http://www.scopus.com/inward/record.url?scp=33750854901&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33750854901&partnerID=8YFLogxK

U2 - 10.1017/S143192760606524X

DO - 10.1017/S143192760606524X

M3 - Article

AN - SCOPUS:33750854901

VL - 12

SP - 932

EP - 933

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - SUPPL. 2

ER -