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Copper deposition in the presence of surface-confined additives
Elias D. Eliadis
,
Ralph G. Nuzzo
,
Andrew A. Gewirth
,
Richard C. Alkire
Chemistry
Materials Research Lab
Chemical and Biomolecular Engineering
Research output
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peer-review
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Keyphrases
Chain Length
100%
Alkanethiol
100%
Copper Deposition
100%
Surface-confined
100%
Defect Density
50%
X-ray Photoelectron Spectroscopy
50%
Cyclic Voltammetry
50%
In Situ Atomic Force Microscopy
50%
Electrodeposition
50%
Thiols
50%
Thiolate
50%
Spectroscopic Analysis
50%
Nucleation Centers
50%
Electrodeposit
50%
Au Electrode
50%
High Current Density
50%
Short Chain
50%
Sulfuric Acid Solution
50%
Galvanostatic Deposition
50%
Applied Current Density
50%
Over Potential
50%
X-ray Photoelectron
50%
Material Science
Monolayers
100%
Surface (Surface Science)
100%
Density
50%
Defect Density
25%
Nucleation
25%
X-Ray Photoelectron Spectroscopy
25%
Cyclic Voltammetry
25%
Electrodeposition
25%
Photoemission Spectroscopy
25%
Atomic Force Microscopy
25%
Chemical Engineering
Sulfuric Acid
100%
Electrodeposition
100%