Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces

U. Weierstall; J. M. Zuo; T. Kjorsvik; J. C.H. Spence

doi:10.1016/S0039-6028(99)00922-X

Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces

U. Weierstall, J. M. Zuo, T. Kjorsvik, J. C.H. Spence

Research output: Contribution to journal › Article › peer-review

Abstract

This paper describes the design and construction of a dedicated UHV diffraction camera with an energy filter for convergent beam reflection electron diffraction (CB-RHEED). The advantages of this system for studying surface structures are demonstrated through applications to silicon (111) and (001) reconstructed surfaces. CB-RHEED patterns of the Si(001)-2×1 reconstruction clearly show a mirror symmetry at room temperature, which is not present in dynamical calculations with the buckled dimer model.

Original language	English (US)
Pages (from-to)	239-250
Number of pages	12
Journal	Surface Science
Volume	442
Issue number	2
DOIs	https://doi.org/10.1016/S0039-6028(99)00922-X
State	Published - Nov 20 1999
Externally published	Yes

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/S0039-6028(99)00922-X

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@article{cbc3d24dc9e3407f901c7e483bc695c2,

title = "Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces",

abstract = "This paper describes the design and construction of a dedicated UHV diffraction camera with an energy filter for convergent beam reflection electron diffraction (CB-RHEED). The advantages of this system for studying surface structures are demonstrated through applications to silicon (111) and (001) reconstructed surfaces. CB-RHEED patterns of the Si(001)-2×1 reconstruction clearly show a mirror symmetry at room temperature, which is not present in dynamical calculations with the buckled dimer model.",

author = "U. Weierstall and Zuo, {J. M.} and T. Kjorsvik and Spence, {J. C.H.}",

note = "Funding Information: This work was supported by NSF award number DMR-9814055.",

year = "1999",

month = nov,

day = "20",

doi = "10.1016/S0039-6028(99)00922-X",

language = "English (US)",

volume = "442",

pages = "239--250",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

number = "2",

}

TY - JOUR

T1 - Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces

AU - Weierstall, U.

AU - Zuo, J. M.

AU - Kjorsvik, T.

AU - Spence, J. C.H.

N1 - Funding Information: This work was supported by NSF award number DMR-9814055.

PY - 1999/11/20

Y1 - 1999/11/20

N2 - This paper describes the design and construction of a dedicated UHV diffraction camera with an energy filter for convergent beam reflection electron diffraction (CB-RHEED). The advantages of this system for studying surface structures are demonstrated through applications to silicon (111) and (001) reconstructed surfaces. CB-RHEED patterns of the Si(001)-2×1 reconstruction clearly show a mirror symmetry at room temperature, which is not present in dynamical calculations with the buckled dimer model.

AB - This paper describes the design and construction of a dedicated UHV diffraction camera with an energy filter for convergent beam reflection electron diffraction (CB-RHEED). The advantages of this system for studying surface structures are demonstrated through applications to silicon (111) and (001) reconstructed surfaces. CB-RHEED patterns of the Si(001)-2×1 reconstruction clearly show a mirror symmetry at room temperature, which is not present in dynamical calculations with the buckled dimer model.

UR - http://www.scopus.com/inward/record.url?scp=0033344887&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033344887&partnerID=8YFLogxK

U2 - 10.1016/S0039-6028(99)00922-X

DO - 10.1016/S0039-6028(99)00922-X

M3 - Article

AN - SCOPUS:0033344887

SN - 0039-6028

VL - 442

SP - 239

EP - 250

JO - Surface Science

JF - Surface Science

IS - 2

ER -

Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces

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