Abstract
This paper describes the design and construction of a dedicated UHV diffraction camera with an energy filter for convergent beam reflection electron diffraction (CB-RHEED). The advantages of this system for studying surface structures are demonstrated through applications to silicon (111) and (001) reconstructed surfaces. CB-RHEED patterns of the Si(001)-2×1 reconstruction clearly show a mirror symmetry at room temperature, which is not present in dynamical calculations with the buckled dimer model.
Original language | English (US) |
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Pages (from-to) | 239-250 |
Number of pages | 12 |
Journal | Surface Science |
Volume | 442 |
Issue number | 2 |
DOIs | |
State | Published - Nov 20 1999 |
Externally published | Yes |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry