This letter discusses an experimental method to suppress spontaneous transitions between low- and high-amplitude oscillatory responses in tapping-mode atomic force microscopy in the absence of feedback control. Here, the cantilever is excited at two frequencies and the dynamic force curves for different excitation amplitudes are recorded. Experimental observations of the dual-frequency excitation strategy are reported for three different cantilevers. These suggest that such transitions may indeed be eliminated from a region of interest of separations between the sample surface and the average position of the cantilever support even with relatively small secondary excitation amplitudes.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)