Controlling bistability in tapping-mode atomic force microscopy using dual-frequency excitation

Phanikrishna Thota, Scott MacLaren, Harry Dankowicz

Research output: Contribution to journalArticlepeer-review

Abstract

This letter discusses an experimental method to suppress spontaneous transitions between low- and high-amplitude oscillatory responses in tapping-mode atomic force microscopy in the absence of feedback control. Here, the cantilever is excited at two frequencies and the dynamic force curves for different excitation amplitudes are recorded. Experimental observations of the dual-frequency excitation strategy are reported for three different cantilevers. These suggest that such transitions may indeed be eliminated from a region of interest of separations between the sample surface and the average position of the cantilever support even with relatively small secondary excitation amplitudes.

Original languageEnglish (US)
Article number093108
JournalApplied Physics Letters
Volume91
Issue number9
DOIs
StatePublished - 2007

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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