Control techniques for high-speed dynamic mode imaging in atomic force microscopes

Gayathri Mohan, Chibum Lee, Srinivasa M Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper proposes a new dynamic mode of operation in an Atomic Force Microscope (AFM) where the deflection signal is used for force regulation instead of its derivatives such as the amplitude and phase. This mode is especially useful in AFMs with high speed positioning systems with bandwidths of the order of ≈ 1/10 times the natural frequency of the scanning probe. We formulate this problem in an optimal control setting and employ multiobjective optimization techniques to design the regulating controller. Furthermore, we present a method to estimate the tip-sample interaction force and extract the sample topography information from this estimate. The overall scheme facilitates high speed imaging that can potentially exploit fast scanning devices without compromising on the bandwidth and resolution. Simulation results show a regulation bandwidth of 10-15% of the natural frequency of the probe.

Original languageEnglish (US)
Title of host publication2011 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011
Pages651-656
Number of pages6
DOIs
StatePublished - Dec 1 2011
Event2011 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011 - Orlando, FL, United States
Duration: Dec 12 2011Dec 15 2011

Publication series

NameProceedings of the IEEE Conference on Decision and Control
ISSN (Print)0191-2216

Other

Other2011 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011
CountryUnited States
CityOrlando, FL
Period12/12/1112/15/11

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Modeling and Simulation
  • Control and Optimization

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  • Cite this

    Mohan, G., Lee, C., & Salapaka, S. M. (2011). Control techniques for high-speed dynamic mode imaging in atomic force microscopes. In 2011 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011 (pp. 651-656). [6160734] (Proceedings of the IEEE Conference on Decision and Control). https://doi.org/10.1109/CDC.2011.6160734