Control on a molecular scale: A perspective

Rolf Findeisen, Martha A. Grover, Christian Wagner, Michael Maiworm, Ruslan Temirov, F. Stefan Tautz, Murti V. Salapaka, Srinivasa Salapaka, Richard D. Braatz, S. O.Reza Moheimani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Imaging and manipulating objects down to the molecular level plays a crucial role in many disciplines. It allows to unravel molecular phenomena, to form materials with new chemical and physical properties, or to build objects on an atomic scale. Science on the nanoscale is inherently interdisciplinary. It requires knowledge and insight into many fields, spanning from modeling, measuring, imaging, actuation to control. Often feedback control facilitates operation with molecular precision, despite the fact that many physical phenomena at the molecular level are still not well understood, and that stochastic and nonlinear effects are inherently present. This work provides an insight into some of the current control related research activities on a molecular scale. This is done considering examples from different fields: control related to scanning probe microscopy such as atomic force microscopy, controlled self assembly on a molecular scale, control aspects of molecular transport, and the use of control for manipulation of single molecules using macroscopic probe tips. The hope is that control related researchers, who are not experts in these fields, become aware of the opportunities present, which could also drive new theoretical developments.

Original languageEnglish (US)
Title of host publication2016 American Control Conference, ACC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3069-3082
Number of pages14
ISBN (Electronic)9781467386821
DOIs
StatePublished - Jul 28 2016
Externally publishedYes
Event2016 American Control Conference, ACC 2016 - Boston, United States
Duration: Jul 6 2016Jul 8 2016

Publication series

NameProceedings of the American Control Conference
Volume2016-July
ISSN (Print)0743-1619

Other

Other2016 American Control Conference, ACC 2016
Country/TerritoryUnited States
CityBoston
Period7/6/167/8/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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