Abstract
Recent works show that the yield strength of metals increases steeply with decreasing sample size. In this work, it is shown that this sample size effect can be rationalized almost completely by considering the stochastics of dislocation source lengths in samples of finite size. The statistical first and second moments of the effective source length are derived as a function of sample size. The sample strength predicted from this effective length compares well with data.
Original language | English (US) |
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Pages (from-to) | 313-316 |
Number of pages | 4 |
Journal | Scripta Materialia |
Volume | 56 |
Issue number | 4 |
DOIs | |
State | Published - Feb 2007 |
Externally published | Yes |
Keywords
- Dislocation
- Size
- Source
- Stochastics
- Yield
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Materials Science
- Metals and Alloys