Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris

Research output: Contribution to journalArticle

Abstract

We present a comprehensive methodology for the electrodynamic modeling of substrate noise coupling. A new and efficient method is introduced for the calculation of the Green’s function that can accommodate arbitrary substrate doping profiles and thus facilitate substrate noise analysis using boundary element methods. In addition to a discussion of the application of the method and its validation in the context of substrate transfer resistance extraction, preliminary results from its application to frequency-dependent substrate noise modeling are presented also.

Original languageEnglish (US)
Pages (from-to)2-9
Number of pages8
JournalIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
DOIs
StatePublished - Jan 1 2002

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Boundary element method
Substrates
Electrodynamics
Green's function
Doping (additives)

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

Cite this

Comprehensive frequency-dependent substrate noise analysis using boundary element methods. / Li, Hongmei; Carballido, Jorge; Yu, Harry H.; Okhmatovski, Vladimir I.; Rosenbaum, Elyse; Cangellaris, Andreas C.

In: IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, 01.01.2002, p. 2-9.

Research output: Contribution to journalArticle

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