Abstract
We present a comprehensive methodology for the electrodynamic modeling of substrate noise coupling. A new and efficient method is introduced for the calculation of the Green's function that can accommodate arbitrary substrate doping profiles and thus facilitate substrate noise analysis using boundary element methods. In addition to a discussion of the application of the method and its validation in the context of substrate transfer resistance extraction, preliminary results from its application to frequency-dependent substrate noise modeling are presented also.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2-9 |
| Number of pages | 8 |
| Journal | IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers |
| DOIs | |
| State | Published - 2002 |
| Event | IEEE/ACM International Conference on Computer Aided Design (ICCAD) - San Jose, CA, United States Duration: Nov 10 2002 → Nov 14 2002 |
ASJC Scopus subject areas
- Software
- Computer Science Applications
- Computer Graphics and Computer-Aided Design