Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris

Research output: Contribution to journalConference article

Abstract

We present a comprehensive methodology for the electrodynamic modeling of substrate noise coupling. A new and efficient method is introduced for the calculation of the Green's function that can accommodate arbitrary substrate doping profiles and thus facilitate substrate noise analysis using boundary element methods. In addition to a discussion of the application of the method and its validation in the context of substrate transfer resistance extraction, preliminary results from its application to frequency-dependent substrate noise modeling are presented also.

Original languageEnglish (US)
Pages (from-to)2-9
Number of pages8
JournalIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
DOIs
StatePublished - Dec 1 2002
EventIEEE/ACM International Conference on Computer Aided Design (ICCAD) - San Jose, CA, United States
Duration: Nov 10 2002Nov 14 2002

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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