Comprehensive ESD protection for RF inputs

Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate that narrow-band tuned circuits may be used for ESD protection of RF inputs, and a figure of merit for optimization of these circuits is presented. The performance of the ESD protected RF circuit is dependent on the quality factor of the ESD device, and various protection devices are evaluated in this work. Broadband circuit protection is also addressed.

Original languageEnglish (US)
Title of host publication2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003
PublisherESD Association
ISBN (Electronic)1585370576, 9781585370573
StatePublished - Jan 1 2003
Event25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003 - Las Vegas, United States
Duration: Sep 21 2003Sep 25 2003

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2003-January
ISSN (Print)0739-5159

Other

Other25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003
CountryUnited States
CityLas Vegas
Period9/21/039/25/03

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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