Comparison of techniques for model order reduction of frequency-dependent networks

Thong Nguyen, Jose Schutt-Aine

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The constant increase in complexity and functionality of integrated circuit (IC) systems has resulted in large-scale systems that require advanced techniques for simulation at the verification stage. Signal integrity analysis has become more crucial in helping reduce time and production manufacturing costs. This is particularly critical for high-speed networks with transmission-line where crosstalk, skin effect, dispersion and jitter, often lead to malfunction and faulty products. From a circuit analysis perspective, the dynamical order of such systems is in principle infinity. Moreover, the number of ports of such systems can be in the hundreds which makes the analysis of such networks prohibitive. Model order reduction (MOR) has been used not only to reduce the size of the problem but to extract an optimum, relatively smaller system or macro-model for time-domain simulations. This paper explores two of the currently most popular techniques for performing MOR, namely, the Vector Fitting and Loewner Matrix methods. A comparison between the two methods is drawn and some examples are illustrated.

Original languageEnglish (US)
Title of host publication2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages87-89
Number of pages3
ISBN (Electronic)9781509061846
DOIs
StatePublished - Apr 5 2017
Event2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016 - Honolulu, United States
Duration: Dec 14 2016Dec 16 2016

Publication series

Name2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016

Other

Other2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016
CountryUnited States
CityHonolulu
Period12/14/1612/16/16

Keywords

  • Convolution
  • Loewner Matrix
  • Macromodel
  • Scattering Parameters
  • Vector Fitting

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Modeling and Simulation

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