Comparison of Plasma Plume Characteristics Obtained Using PIC-DSMC Approach with Boltzmann Approximations

Revathi Jambunathan, Deborah Levin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ion thruster plumes, consisting of neutrals, ions, and electrons, interact with the spacecraft surface and the solar panels in the backflow region, affecting their performance 1. Therefore, an understanding of the plume characteristics, the charge-exchange reactions2, and ion energy distribution in the backflow region plays an important role in the design of such thrusters. Generally, ion thruster plumes are modeled using a single-temperature Boltzmann relation to obtain the electric potential under the assumption of quasi-neutrality. However, the electron temperature not only varies as a result of expansion, but is also found to be anisotropic. Recently, we developed a three-dimensional, multi-GPU, octree-based PIC-DSMC3 solver to self-consistently model the induced electric field as well as the momentum and charge-exchange reactions.

Original languageEnglish (US)
Title of host publicationICOPS 2018 - 45th IEEE International Conference on Plasma Science
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538645895
DOIs
StatePublished - Jun 24 2018
Event45th IEEE International Conference on Plasma Science, ICOPS 2018 - Denver, United States
Duration: Jun 24 2018Jun 28 2018

Publication series

NameIEEE International Conference on Plasma Science
Volume2018-June
ISSN (Print)0730-9244

Conference

Conference45th IEEE International Conference on Plasma Science, ICOPS 2018
Country/TerritoryUnited States
CityDenver
Period6/24/186/28/18

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Comparison of Plasma Plume Characteristics Obtained Using PIC-DSMC Approach with Boltzmann Approximations'. Together they form a unique fingerprint.

Cite this