Comparison of 1.9 eV InGaP front- And rear-junction solar cells grown on Si

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, we compare the performance of front-junction (FJ) and rear-heterojunction (RHJ) 1.9 eV InGaP solar cells grown on Si by molecular beam epitaxy (MBE). The RHJs had greater Voc than the FJs on Si, even with 10 × higher threading dislocation density (TDD), indicating superior dislocation tolerance of the n-type absorber of the RHJ compared to the p-type absorber of the FJ. However, poor internal quantum efficiency (IQE) of the RHJ on Si due to insufficient diffusion length also limited cell efficiency. Based on modeling, a thinner RHJ absorber will greatly boost the short circuit current density (Jsc), enabling high-performance InGaP RHJs for epitaxial III-V/Si solar cells.

Original languageEnglish (US)
Title of host publication2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2614-2615
Number of pages2
ISBN (Electronic)9781665419222
DOIs
StatePublished - Jun 20 2021
Event48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States
Duration: Jun 20 2021Jun 25 2021

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Country/TerritoryUnited States
CityFort Lauderdale
Period6/20/216/25/21

Keywords

  • III-V/Si
  • InGaP
  • MBE
  • RHJ
  • rear hetero-junction

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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