Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients

Shudong Huang, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work presents a non-quasi-static compact model of ESD diodes for circuit simulation. The model accurately predicts the transient behavior of the diode during both turn-on and turn-off. The accurate representation of the turn-off transient is achieved in part by modeling the time delay from an applied reverse bias to the avalanche multiplication of the reverse current. There is good agreement between measurement and simulation, even when the device is tested using sinusoidal rather than square pulses.

Original languageEnglish (US)
Title of host publication2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728168937
DOIs
StatePublished - Mar 2021
Externally publishedYes
Event2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Virtual, Monterey, United States
Duration: Mar 21 2021Mar 24 2021

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
Volume2021-March
ISSN (Print)1541-7026

Conference

Conference2021 IEEE International Reliability Physics Symposium, IRPS 2021
Country/TerritoryUnited States
CityVirtual, Monterey
Period3/21/213/24/21

Keywords

  • Diode
  • electrostatic discharge
  • semiconductor device modelling

ASJC Scopus subject areas

  • General Engineering

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