Comments on "on deembedding of port discontinuities in full-wave CAD models of multiport circuits" and related comments

Marco Farina, V. I. Okhmatovski, J. D. Morsey, A. C. Cangellaris

Research output: Contribution to journalComment/debate

Original languageEnglish (US)
Number of pages1
JournalIEEE Transactions on Microwave Theory and Techniques
Volume53
Issue number5
DOIs
StatePublished - May 1 2005

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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