Information from imaging and diffraction planes, or real and reciprocal spaces, of transmission electron microscopes (TEM) can be combined using iterative transformation algorithms to reconstruct the complex wave function, to improve image resolution and to remove residual aberrations in the case of aberration corrected TEM. Here, we describe the experimental and computation techniques needed for combining real and reciprocal space information. We demonstrate these techniques by reconstructing the complex wave function of quantum dots and carbon nanotubes beyond the microscope's resolution limit.
- Aberration correction
- Diffraction imaging
- Electron diffraction
- Imaging resolution
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials