Combined TLP/RF testing system for detection of ESD failures in RF circuits

Sami Hyvonen; Sopan Joshi; Elyse Rosenbaum

Combined TLP/RF testing system for detection of ESD failures in RF circuits

Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a modified TLP measurement system in which full functional RF testing, along with conventional leakage current measurement, is performed after each pulse to detect failure. Measurement results from 5-GHz LNAs show that RF metrics degrade before the leakage current increases. Also, we introduce an ESD-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.

Original language	English (US)
Title of host publication	2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003
Publisher	ESD Association
ISBN (Electronic)	1585370576, 9781585370573
State	Published - 2003
Event	25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003 - Las Vegas, United States Duration: Sep 21 2003 → Sep 25 2003

Publication series

Name	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume	2003-January
ISSN (Print)	0739-5159

Other

Other	25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003
Country/Territory	United States
City	Las Vegas
Period	9/21/03 → 9/25/03

ASJC Scopus subject areas

Electrical and Electronic Engineering

Library availability

Discover UIUC Full Text

Cite this

Combined TLP/RF testing system for detection of ESD failures in RF circuits. / Hyvonen, Sami; Joshi, Sopan; Rosenbaum, Elyse.
2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003. ESD Association, 2003. 5272004 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hyvonen, S, Joshi, S & Rosenbaum, E 2003, Combined TLP/RF testing system for detection of ESD failures in RF circuits. in 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003., 5272004, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, vol. 2003-January, ESD Association, 25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003, Las Vegas, United States, 9/21/03.

@inproceedings{36fba5702f96425197bc0c78ca88aa11,

title = "Combined TLP/RF testing system for detection of ESD failures in RF circuits",

abstract = "We present a modified TLP measurement system in which full functional RF testing, along with conventional leakage current measurement, is performed after each pulse to detect failure. Measurement results from 5-GHz LNAs show that RF metrics degrade before the leakage current increases. Also, we introduce an ESD-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.",

author = "Sami Hyvonen and Sopan Joshi and Elyse Rosenbaum",

note = "Publisher Copyright: {\textcopyright} 2003 ESDA.; 25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003 ; Conference date: 21-09-2003 Through 25-09-2003",

year = "2003",

language = "English (US)",

series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

publisher = "ESD Association",

booktitle = "2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003",

}

TY - GEN

T1 - Combined TLP/RF testing system for detection of ESD failures in RF circuits

AU - Hyvonen, Sami

AU - Joshi, Sopan

AU - Rosenbaum, Elyse

PY - 2003

Y1 - 2003

N2 - We present a modified TLP measurement system in which full functional RF testing, along with conventional leakage current measurement, is performed after each pulse to detect failure. Measurement results from 5-GHz LNAs show that RF metrics degrade before the leakage current increases. Also, we introduce an ESD-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.

AB - We present a modified TLP measurement system in which full functional RF testing, along with conventional leakage current measurement, is performed after each pulse to detect failure. Measurement results from 5-GHz LNAs show that RF metrics degrade before the leakage current increases. Also, we introduce an ESD-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.

UR - http://www.scopus.com/inward/record.url?scp=84945208698&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84945208698&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84945208698

T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

BT - 2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003

PB - ESD Association

T2 - 25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003

Y2 - 21 September 2003 through 25 September 2003

ER -

Combined TLP/RF testing system for detection of ESD failures in RF circuits

Abstract

Publication series

Other

ASJC Scopus subject areas

Library availability

Related links

Fingerprint

Cite this