Combined TLP/RF testing system for detection of ESD failures in RF circuits

Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a modified TLP measurement system in which full functional RF testing, along with conventional leakage current measurement, is performed after each pulse to detect failure. Measurement results from 5-GHz LNAs show that RF metrics degrade before the leakage current increases. Also, we introduce an ESD-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.

Original languageEnglish (US)
Title of host publication2003 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003
PublisherESD Association
ISBN (Electronic)1585370576, 9781585370573
StatePublished - Jan 1 2003
Event25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003 - Las Vegas, United States
Duration: Sep 21 2003Sep 25 2003

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2003-January
ISSN (Print)0739-5159

Other

Other25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003
CountryUnited States
CityLas Vegas
Period9/21/039/25/03

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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